Mesoscale materials are of great importance for electrochemical applications, especially in technologies such as fuel cells and batteries. Our research group combines mesoscale materials chemistry with rigorous atomic-scale structural analysis to explain the origin of materials properties:
- Synthesis: We synthesize materials via solvothermal reactions (e.g., for metal organic frameworks) 1,2, low temperature reduction reactions (e.g., for conductive oxides) 3–5 and electrochemical reactions (e.g., for metal nanostructures) 6.
- Analysis: We analyze atomic structures by general technique such as IR spectroscopy and X-ray diffraction as well as X-ray pair distribution functions (PDFs) 7. In addition to the laboratory X-ray measurements, we often use synchrotron facilities. The data is analyzed using in-house programs as well as other major programs for the real-space Rietveld analysis and the Reverse Monte Carlo method. The structures are modeled via molecular mechanics simulations as well as density-functional theory (DFT) calculations.
- Properties: We measure electrochemical properties using a range of setups including general techniques such as rotating disk electrode (RDE) and electrochemical impedance spectroscopy (EIS), in addition to more exotic methods such as measuring the ion/electron conductivities for single crystals 8,9. In addition to these property measurements and structure analysis, we carry out a variety of technique such as synchrotron X-ray photoelectron spectroscopy to understand the mechanism 2,7.
Tominaka, S.; Coudert, F. X.; Dao, T. D.; Nagao, T.; Cheetham, A. K.; J. Am. Chem. Soc.; 2015; 137, 6428.
Tominaka, S.; Hamoudi, H.; Suga, T.; Bennett, T. D.; Cairns, A. B.; Cheetham, A. K.; Chem. Sci.; 2015; 6, 1465.
Tominaka, S.; Inorg. Chem.; 2012; 51, 10136.
Tominaka, S.; Chem. Commun.; 2012; 48, 7949.
Tominaka, S.; Tsujimoto, Y.; Matsushita, Y.; Yamaura, K.; Angew. Chemie-International Ed.; 2011; 50, 7418.
Tominaka, S.; J. Mater. Chem.; 2011; 21, 9725.
Tominaka, S.; Yoshikawa, H.; Matsushita, Y.; Cheetham, A. K.; Mater. Horiz.; 2014; 1, 106.
Tominaka, S.; Cheetham, A. K.; RSC Adv.; 2014; 4, 54382.
Tominaka, S.; Henke, S.; Cheetham, A. K.; Crystengcomm; 2013; 15, 9400.